Author: Thomas W. Williams

Publications

Co-authors

Nodari Sitchinava

1

Minesh B. Amin

1

Rohit Kapur

2

Productive Colleagues

Nodari Sitchinava

1

Minesh B. Amin

1

Rohit Kapur

3

Publications

Samaranayake, Samitha, Sitchinava, Nodari, Kapur, Rohit, Amin, Minesh B., Williams, Thomas W. (2002): Dynamic Scan: Driving Down the Cost of Test. In IEEE Computer, 35 (10) pp. 63-68. https://csdl.computer.org/comp/mags/co/2002/10/rx063abs.htm

Kapur, Rohit, Williams, Thomas W. (1999): Tough Challenges as Design and Test Go Nanometer - Guest Editors\' Introduction. In IEEE Computer, 32 (11) pp. 42-45.

Williams, Thomas W. (1984): VLSI Testing. In IEEE Computer, 17 (10) pp. 126-136.