Robert C. Aitken

Publication Statistics

Publication period start
1999
Publication period end
1999
Number of co-authors
0

Co-authors

Number of publications with favourite co-authors

Productive Colleagues

Most productive colleagues in number of publications

Publications

Aitken, Robert C. (1999): Nanometer Technology Effects on Fault Models for IC Testing. In IEEE Computer, 32 (11) pp. 46-51.