Author: Kendra N. Schmid
Publications
Publication period start: 2005
Number of co-authors: 3
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Publications
Wasson, Kimberly S., Schmid, Kendra N., Lutz, Robyn R., Knight, John C. (2005): Using Occurrence Properties of Defect Report Data to Improve Requirements. In: 13th IEEE International Conference on Requirements Engineering RE 2005 29 August - 2 September, 2005, Paris, France. pp. 253-262. https://doi.ieeecomputersociety.org/10.1109/RE.2005.77