John P. Hayes

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Publication Statistics

Publication period start
1989
Publication period end
1996
Number of co-authors
2

Co-authors
Number of publications with favourite co-authors

Productive Colleagues
Most productive colleagues in number of publications

Publications

Murray, Brian T., Hayes, John P. (1996): Testing ICs: Getting to the Core of the Problem. In IEEE Computer, 29 (11) pp. 32-38.

Bhattacharya, Debashis, Murray, Brian T., Hayes, John P. (1989): High-Level Test Generation for VLSI. In IEEE Computer, 22 (4) pp. 16-24.