Author: John Lynch

Publications

Publication period start: 2000
Number of co-authors: 3

Co-authors

Number of publications with favourite co-authors
Ritu Agarwal
1
Jayesh Prasad
1
Mohan Tanniru
1

Productive Colleagues

Most productive colleagues in number of publications
Jayesh Prasad
4
Mohan Tanniru
6
Ritu Agarwal
14

Publications

Agarwal, Ritu, Prasad, Jayesh, Tanniru, Mohan, Lynch, John (2000): Risks of rapid application development. In Communications of the ACM, 43 (11) pp. 1. https://dl.acm.org/doi/10.1145/352515.352516

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