John Lynch

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Publication Statistics

Publication period start
2000
Publication period end
2000
Number of co-authors
3

Co-authors
Number of publications with favourite co-authors

Productive Colleagues
Most productive colleagues in number of publications

Publications

Agarwal, Ritu, Prasad, Jayesh, Tanniru, Mohan, Lynch, John (2000): Risks of rapid application development. In Communications of the ACM, 43 (11) pp. 1. http://doi.acm.org/10.1145/352515.352516