Author: Narayanan Vijaykrishnan

Publications

Publication period start: 2006
Number of co-authors: 9

Co-authors

Number of publications with favourite co-authors
Mary Jane Irwin
1
Mahmut T. Kandemir
1
Yuan Xie
1

Productive Colleagues

Most productive colleagues in number of publications
Mahmut T. Kandemir
4
Todd M. Austin
5
Trevor N. Mudge
8

Publications

Vijaykrishnan, Narayanan, Xie, Yuan (2006): Reliability Concerns in Embedded System Designs. In IEEE Computer, 39 (1) pp. 118-120. https://doi.ieeecomputersociety.org/10.1109/MC.2006.31

Kim, Nam Sung, Austin, Todd M., Blaauw, David, Mudge, Trevor N., Flautner, Krisztián, Hu, Jie S., Irwin, Mary Jane, Kandemir, Mahmut T., Vijaykrishnan, Narayanan (2003): Leakage Current: Moore\'s Law Meets Static Power. In IEEE Computer, 36 (12) pp. 68-75. https://csdl.computer.org/comp/mags/co/2003/12/rz068abs.htm

New to UX Design? We’re giving you a free ebook!

The Basics of User Experience Design

Download our free ebook The Basics of User Experience Design to learn about core concepts of UX design.

In 9 chapters, we’ll cover: conducting user interviews, design thinking, interaction design, mobile UX design, usability, UX research, and many more!

A valid email address is required.
311,220 designers enjoy our newsletter—sure you don’t want to receive it?

New to UX Design? We’re Giving You a Free ebook!

The Basics of User Experience Design

Download our free ebook The Basics of User Experience Design to learn about core concepts of UX design.

In 9 chapters, we’ll cover: conducting user interviews, design thinking, interaction design, mobile UX design, usability, UX research, and many more!

A valid email address is required.
311,220 designers enjoy our newsletter—sure you don’t want to receive it?