No description available of Nik Chmiel...
Gardner, Peter H., Chmiel, Nik and Wall, Toby D. (1996): Implicit Knowledge and Fault Diagnosis in the Control of Advanced Manufacturing Technology. In Behaviour and Information Technology, 15 (4) pp. 205-212
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Publication period:1996-1996
Publication count:1
Number of co-authors:1
Nik Chmiel's 3 most productive colleagues in number of publications:
Toby D. Wall:2Number of publications with 3 favourite co-authors:
Toby D. Wall:1Learn more about Nik Chmiel:
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